New and Refurbished Electronic Test Equipment by Agilent Anritsu BMI Biddle Boonton Dranetz Data I/O Fluke FW Bell EIP EMS ENI Gen-Rad Hitachi Hipotronics Hughes Keithley Lambda Leader  Philips Tektronix Wavetek Wiltron Yokogawa.

    *  Analyzers: Spectrum, Logic, Network, Power Line and others
    * Frequency counters: Microwave, Pulse, Universal
    * Generators: Function, Pulse, RF Signal, Video, Data
    * Multimeters, Electrometers, RF meters, LCR, Megohm meters
    * Oscilloscopes, Curve tracers, Probes and Accessories
    * Power supplies, Electronic loads, AC sources, Current Sources
    * Telecommunications test equipment: LAN, Telephone, Cable testers
    * Amplifiers, Data Acquisition, Microwave, Environmental, Laser Test

The HP4062UX Semiconductor Process Control System is the high-end system of the HP4062 Semiconductor Parametric Test System family. The HP4062UX satisfies all of the requirements of the Integrated Circuit Manufacturers for both process monitoring and process development.

HP4145B Semiconductor Parameter Analyzer 

Manufacturer:Temptronic Corporation;Model:TP03500,Condition:New;Model :TP3000,Hot chuck,6 inch,New

The HP 4142B Modular DC Source/Monitor  Offering a wide measurement range and excellent sensitivity, the HP 4142B modular dc source/monitor is a system-use dc measurement instrument especially designed for high-throughput dc semiconductor testers.

HP/Agilent E5250A Low Leakage Switch Mainframe   

For measuring a sequence of many devices on a test structure, the HP/Agilent E5252A (or E5250A option 001) crosspoint matrix module option provides the ideal solution. ---SOLD 

The Model 7002 Switch System is a 10-slot mainframe that supports up to 400 2-pole multiplexer channels or 400 matrix crosspoints. The front panel includes a unique interactive display of channel status for quick programming.Scanning speeds of up to 165 channels per second are possible with the high density switch cards.

The Model 7001 is a half-rack, high density, two-slot mainframe that supports the widest range of signals in the test and measurement industry. DC switching capabilities from nanovolts to 1100V and femtoamps to 5A, as well as RF and optical switch support, make the Model 7001 a versatile production test tool for a wide array of applications.

HP436A Power Meter without sensor

HP437B Power Meter without sensor

The HP 4085B switching matrix in the HP 4062UX Process Controll System produces a 1 pA, 1 mV switching system capable of 48(96)-pin high-resolution semiconductor testing. 

HP16075A relay test adaptor, calibrator of HP4085B

low leakage fixtrue, leads cable from HP4085B to prober station,2x24pin

HP16069 A universal low leakage fixture, leads cable from HP4085B to prober station

HP 16071 A universal fixture, leads cable from HP4085B to prober station

HP16076A system test module, calibrator of HP4085B

HP16077A extention cable fixture

HP 16346B , system calibration module, calibrator of HP4085B

HP/Agilent 4284A Precision LCR Meter(20Hz-10MHz) , Utilize state-of-the art measurement technologies  

The Model 16058A Test Fixture is designed for use with the HP 4145A/B Semiconductor Parameter Analyzer.

FTG-12,It is not tested or refurbished.It is sold  *AS-IS WHERE IS*.Allwin21 accepts no responsibility or liability for the use and/or functionality of the system

in2 Series Manipulators For Smaller Test Heads.The Perfect Size for Your Smaller Test Heads .
The stand alone in2 design has been scaled into three product groups, based on the load that needs to be supported. The column size (6", 8", 12") reflects the width of the I-Beam used in the design of the manipulator column