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LC-361C High Voltage Probe |
LC-361C high voltage manual probe station with accessories for tektronik 371A curve tracer and five high voltage probe tips. There are terminals inside probe station for the accessories of 371A.There is a cover for both high voltage (5000V) safety and for testing in the dark without light.There are other extra 5 individual BNC connectors for other high voltage testers. |
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ELECTROGLAS EG 2001 Prober |
The 2000 series wafer probers are controlled and operated through the use of two consoles (the operator’s console and the monitor console), simple push-button controls on each indexer (cassette handling platform), and basic camera illumination controls on the front of the power module.
The unique ELECTROGLAS solid-state high-speed X-Y Positioning System permits simplified wafer loading and unloading outside the probe ring area with high-speed travel to and from the load position. |
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Refurbished EG 1034 |
The ELECTROGLAS 1034X is designed for operational simplicity and fast wafer throughput. The unique ELECTROGLAS solid-state high-speed X-Y Positioning System permits simplified wafer loading and unloading outside the probe ring area with high-speed travel to and from the load position. |
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Refurbished ELECTROGLAS HORIZON 4085X |
Manufacturer:ElectronGlas,Condition:Used and good condition,Amount: 12 sets |
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EG 2010 |
The ELECTROGLAS 2010 wafer probers are extremely accurate, modularly designed automatic wafer probers, configured to perform automatic system functions of: |
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Rucker and Kolls Model 260J Probing Station |
Rucker and Kolls Model 260J Probing Station which is designed for critical manual probing. It incorporates a standard 4" chuck, X-Y positioning, theta adjustment and dual z-motion control handles (left and right). |
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SIGNATONE S-250 Probe |
Manfacturer:Signatone.Condition:Used and Good Condition,complete,working condition.Amount: 1 set ,SIGNATONE S-250 WAFER INSPECTION PROBE / MICROMANIPULATOR |
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Refurbished MP 2020 |
The Wentworth MP2020 is a semi-automatic prober of laboratory and industrial production line to measure PCM parameter, the chuck which used for different temperature tests can be heated or colded (such as liquid nitrogen).The electrical engineering controls a microscope, make operation of left and right(X), front and back(Y) and up and down(Z) in convenience. Moreover the Z of microscope has two files, so that the operation of shield only on the constitution with probe card under the microscope of block plank is convenience. |
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