|    Inquiry Sales Contact: Phone: 001-408-988-5188 E-mail: sales@allwin21.com
 
Products

 Rapid Thermal Process
 
·AccuThermo AW 410
·AccuThermo AW 610
·AccuThermo AW 810
·AccuThermo AW 820
·AccuThermo AW 830
·AccuThermo AW 610V
·AccuThermo AW 820V
·AccuThermo AW 860V
·Heatpulse 210/410/610
 Plasma Asher Descum
 
·Matrix 105R
·Matrix 105/205/106
·Branson IPC L3200
·Branson IPC 2000/3000/4000
·Gasonics L3510
·Gasonics Aura 1000
·Gasonics Aura 3010
·Gasonics Aura 2000LL
 Plasma Etch/RIE/ICP
 
·Lam Rainbow 4520/4528
·Matrix 303
·Lam AutoEtch 790
·Lam AutoEtch 690
·Lam AutoEtch 590
·Lam AutoEtch 490
·Gasonics AE 2001
·Lam Rainbow 4620/4628
·Lam Rainbow 4420/4428
·Tegal 903e TTW
·Tegal 901e TTW
·Tegal 903e
·Tegal 901e
·Lam Rainbow 4720/4728
·Surface Tech Sys Multiplex ICP
·STS Multiplex ASE AOE ICP CLUSTER TOOL
 Sputtering Deposition System
 
·AccuSputter AW 4450
·Perkin Elmer 4450
·Perkin Elmer 4410 Sputter
·Perkin Elmer 2400
 Metrology and Tester and Others
 
·Tencor M-Gage 300
·Hitachi CD-SEM 8840
·Hitachi CD-SEM 8820
·Hitachi FE-SEM 4700
·Hitachi FE-SEM 4500
·HP 4062UX
·HP 4145A/B
·EG 2001 Probe
·EG 1034 Probe
·AW PCM System
 

Tencor M-Gage 300

Tencor M-Gage 300 | Hitachi CD-SEM 8840 | Hitachi CD-SEM 8820 | Hitachi FE-SEM 4700 | Hitachi FE-SEM 4500 | HP 4062UX | HP 4145A/B | EG 2001 Probe | EG 1034 Probe| AW PCM System                 Download Brochure

 

KLATencor M-Gage 300  Non-Contact Wafer Monitor for Sheet resistance.

 

We also provide our new Non-Contact Wafer Monitor for Sheet resistance with innovative thinking which has gone into the improved design and manufacture systems. The rebuilt M-Gage is Allwin21’s own tested and proven improved version and is not functionally equivalent clones.

 

·         Can accommodate up to 6"  or 8".

·         Measurement range: 1m ohm/square to 2,000 m  ohm/square.

·         115v, 60 Hz

The new  Non-Contact Wafer Monitor for Sheet resistance configures with AW software package and touch screen panel computer with 12” monitor. The new system can save the data with list and the map in the computer one wafer by one wafer.

 The new system removes the digital data converter. Operator can dial the resistivity in the test set up recipe, run different recipe for Al, ti, Tin.

 

 

Equipment By Categoty : Rapid Thermal Process | Plasma Asher Descum | Plasma Etch/RIE/ICP | Sputtering Deposition System | Metrology and Tester

Equipment By Manufacturers : Allwin21 Corp. | Perkin Elmer | Matrix | Tegal | Lam Research | Gasonics | Branson | STS | ELECTROGLAS | Hitachi | KLA-Tencor | HP

Sales Contact: Phone: 001-408-988-5188 Fax: 001-408-904-7168 Address: 3521 Leonard Court Santa Clara,CA 95054 E-mail: sales@allwin21.com Copyright © 2006-2016 Allwin21,Corp. All Rights Reserved