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Other CD-SEM/SEM/FIB
Condition:
- Fully Refurbished by many years experienced technicians.
- Guaranteed to meet or exceed OEM specifications
- 3 MONTH warranty and specifications guarantee.
- Installation, training, service, and support available worldwide!
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The Micrion 9500 is a highly sophisticated Focused Ion Beam System and is capable of performing very delicate microsurgery and cross-sectioning.
Fine Focused Ion Beam (5nm spot size) can make fast and precise drills and cuts. High resolution imaging makes this system unique for failure/structural analysis.
Well designed deposition system yields reliable interconnections and isolation depositions.
An electron neutralizer eliminates the damages caused by charging effects.
Gas-enhanced etching greatly accelerates the processes and makes selective etching possible.
Configuration:
.FEI / Micrion 9500 Focused Ion Beam System
.Ion Beam Data: Ga, 50kV, 5nm column, 20nA
.Specimen stage: 200mm x 200mm, 5 axis
.Detector: MCP
.Computer/Software: RS6000,AIX 3.15 OS Microsurgery 1.6.4
.GAS: Metal deposition, insulator deposition, insulator etch and metal etch
.Vacuum System: Turbo with mechanical roughing pump
Please contact us for more information by sales@allwin21.com
SEM:
Zeiss/Leo 435VP - W SEM, variable pressure
Zeiss/Leo DSM982 FE SEM
Hitachi S-4500 - FE SEM, Type I and Type II
Hitachi S-4700 - FE SEM, Type II
Hitachi S-4800 - FE SEM, Type II
CD/SEM:
Hitachi S-8820 for 5", 6" or 8", Silicon or GaAs wafers
Hitachi S-8840 for 5", 6" or 8" , Silicon or GaAs wafers
Hitachi S-9300 for 6", 8" or 12 " Silicon wafers
FIB:
FEI/Micrion M9100 Workstation, Gas box optional
FEI/Micrion M9500 Workstation, Gas box optional
Seiko 8300 FIB
Seiko 8100 FIB
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