Condition:
- Fully Refurbished by many years experienced technicians.
- Guaranteed to meet or exceed OEM specifications
- 3 MONTH warranty and specifications guarantee.
- Installation, training, service, and support available worldwide!
SEM:
Zeiss/Leo 435VP - W SEM, variable pressure
Zeiss/Leo DSM982 FE SEM
Hitachi S-4500 - FE SEM, Type I and Type II
Hitachi S-4700 - FE SEM, Type II
Hitachi S-4800 - FE SEM, Type II
CD/SEM:
Hitachi S-8820 for 5", 6" or 8", Silicon or GaAs wafers
Hitachi S-8840 for 5", 6" or 8" , Silicon or GaAs wafers
Hitachi S-9300 for 6", 8" or 12 " Silicon wafers
FIB:
FEI/Micrion M9100 Workstation, Gas box optional
FEI/Micrion M9500 Workstation, Gas box optional
Seiko 8300 FIB
Seiko 8100 FIB
The LEO 982 Field emission scanning electron microscope (FE-SEM, Carl Zeiss SMT Inc. One Corporation Way Peabody, MA 01960) provides a means to achieve ultra high resolution images in the secondary emissive mode. The instrument is an analytical work station that combines secondary imaging capabilities with backscatter electron imaging useful for discriminating elements by atomic number contrast.
These imaging modes combined with an Oxford (Oxford Instruments, Inc., 130a Baker Ave. Ext., Concord, MA 01742) energy dispersive X-ray analyzer allow for positive identification of elements by spectral analysis, mapping of element distribution, combined with qualitative and quantitative analysis of element concentration. Particle sizing, counting, and chemical typing can be achieved using image processing software on the X-ray analyzer using image processing software on the X-ray analyzer.
Attached to the FE-SEM is the Gatan Alto 2500 Cryostage and cryoprep chamber (Gatan UK, Ferrymills 3, Osney Mead, Oxford, OX2 0ES, UK). With the attached vacuum chamber, the sample can be rapidly frozen in LN slush and transferred to the cryoprep chamber. It is kept frozen and can be fractured, sublimated and coated in the chamber, then moved to the cryostage within the SEM and kept frozen while viewed. Several mounts are available to accomodate a variety of specimens.
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